- 博客(0)
- 资源 (1)
- 收藏
- 关注
on-wafer去嵌方法论文
Deembedding a device mounted between a pair of
identical transitions requires the transition two-port parameters.
These can be obtained using the through-line (TL) deembedding
method requiring only through and uniform line deembedding
standards. Other related deembedding methods introduce factors
to scale a pair of eigenvectors to obtain the transition twoport parameters. In this paper, it is shown that these scaling
factors are interdependent and provide a corrective reference
plane adjustment. Moreover, the transition wave-transmission
matrix can be factored into two wave-transmission matrices with
one encapsulating the transition discontinuity and the other of
a matched line to provide a corrective reference plane shift.
This factorization permits incorporation of desired and corrective
reference plane shifts, using data from a second matched line
standard. With an emphasis on substrate-integrated waveguide,
the proposed TL deembedding method is verified.
2018-07-08
空空如也
TA创建的收藏夹 TA关注的收藏夹
TA关注的人