tianshi227的博客

基于GSM模块+单片机开发板资料，提供大家参考，对于设计有一定的帮助

Standby current低功耗电流 Dropout voltage (LDO特性)压降的输入电压 Efficiency功率 Transient response顺势特性 Line regulation线路调整器 Load regulation负载调整率 Power supply rejection电源排除/抑制 Noise Accuracy精确性

匹配网络（Matching） 收发双工器（Diplexer） 声表面波滤波器(SAW) 平衡网络（Balance） 锁相环（PLL） 收发器（Transceiver） 衰减网络（Attenuation） 功率控制环路（APC） 滤波网络（Filter） 其它

第一章 SDRAM的原理和时序 1.1 SDRAM内存模组的物理Bank与芯片位宽 1.1.1 物理Bank 1.1.2 芯片位宽 1.2 SDRAM的逻辑Bank与芯片容量表示方法 1.2.1 逻辑Bank 与芯片位宽 1.2.2 内存芯片的容量 1.2.3 与芯片位宽相关的DIMM 设计

接地/等电位相连接系统 设备接地导体 ANSI/ESD S6.1 ＜1.0欧姆阻抗 辅助接地 ANSI/ESD S6.1 ＜25欧姆到设备接地导体 等电位相连接 ANSI/ESD S6.1 ＜1.0×109欧姆

DLP 投影机电路设计，想学习的朋友，可以看看。。。

8900常用软件 仅供大家参考 8900常用软件 仅供大家参考

摘要：介绍了一种基于ATtiny2313高速单片机的三相混合式步进电动机高细分、高跟踪频率 驱动系统对单片机的要求及软件编制方法，介绍了采用电流跟踪型PWM控制方式下，系统幅值 可设定的D／A转换电路、三角波比较控制方式的偏差PWM发生电路、主电路及电流反馈电路的 设计要点。该系统能在高低频下平稳运行，具有一般伺服电机的运行性能。 关键词：步进电动机；高速单片机；高细分；电流跟踪型PWM

a、信号流畅，信号方向保持一致； b、核心元件为中心； c、在高频电路中，要考虑元器件的分布参数； d、特殊元器件的摆放位置； e、要考虑批量生产时，波峰焊及回流焊的锡流方向及加工传送PCB的工艺因素。

电路组成 简化电路及习惯画法  简单工作原理 放大电路的静态和动态 直流通路和交流通路  书中有关符号的约定

In-system programming has become a mainstream feature in programmable logic devices (PLDs), offering system designers and test engineers significant cost benefits by integrating PLDs into board-level testing. These benefits include reduced inventory of pre-programmed devices, lower costs, fewer devices damaged by handling, and increased flexibility in engineering changes. Altera provides software and device support that integrates in-system programmability (ISP) into existing test flows for the HP 3070 system (ISP is occasionally referred to as “on-board programming”). This application note discusses how to use the HP 3070 test system to achieve faster programming times for Altera ISP-capable devices.

第一节 系统概述 Keil C51是美国Keil Software公司出品的51系列兼容单片机C语言软件开发系统，与汇编相比，C语言在功能上、结构性、可读性、可维护性上有明显的优势，因而易学易用。用过汇编语言后再使用C来开发，体会更加深刻。 Keil C51软件提供丰富的库函数和功能强大的集成开发调试工具，全Windows界面。另外重要的一点，只要看一下编译后生成的汇编代码，就能体会到Keil C51生成的目标代码效率非常之高，多数语句生成的汇编代码很紧凑，容易理解。在开发大型软件时更能体现高级语言的优势。 下面详细介绍Keil C51开发系统各部分功能和使用。

C51编译器的控制指令分为三类：源文件控制类，目标文件控制类及列表控制类。 1. 源文件控制类 NOEXTEND：C51源文件不允许使用ANSI C扩展功能。 DEFINE(DF)：定义预处理(在C51命令行)。 2. 目标文件(Object)控制类： COMPACT LARGE SMALL 选编译模式 DEBUG(DB) 包含调试信息，以供仿真器或dSCope51使用。 NOAMAKE(NOAM) 禁止AutoMake信息记录 NOREGPARMS 禁止用寄存器传递参数 OBJECTEXTEND(OE) Object文件包含附加变量类型信息 OPTIMIZE(OT) 指定优化级别

win2k服务器培训资料。有兴趣的同仁可以下载看看。1 Windows 2000的简介 2 Windows 2000的特点 3 Windows 2000的网络类型 4 Windows 2000的安装

RAM datasheet 详细记录IC性能及测试代码，供大家一起 研究。

边界扫描中文资料，有兴趣可以浏览下。里面用到javascrip来测试boundary scan。

in-circuit-test ，大家可以参考下。此文我也是在网上找了，看内容不错，供大家参考

从DATASHEET提取时钟逻辑信号，用TRI语言TPG实现I2C测试，希望能给大家一起启发

C-2數位元件測試原理.........................................................................................3 C-2-1 TTL邏輯閘測試原理(TTL Logic Test Theorem)..................................3 C-2-1-1 輸入及輸出順序(Input and Output Sequence).........................3 C-2-1-2 GROUP 設定技巧....................................................................4 C-2-2 Tree-Chain 測試原理.........................................................................4 C-2-2-1 測試命令執行動作....................................................................5 C-2-2-2 Tree Chain 測試演算法(Tree Chain Test Algorithm).................6 C-2-3 Memory 測試原理..............................................................................6 C-2-3-1 Walking one for Address bus....................................................7 C-2-3-2 Walking zero for Address bus...................................................8 C-2-3-3 Data bus...................................................................................8 C-2-4 I2C 基本概念......................................................................................9 C-2-5 P2C 基本概念..................................................................................12 C-2-6 Boundary-Scan測試原理.................................................................13 C-2-6-1 Boundary-Scan 基本概念......................................................13 C-2-6-2 Boundary-Scan 測試原理......................................................14 C-2-7 快閃記憶體(Flash Memory)測試原理...............................................19 C-2-8 MWIRE Serial EEPROM基本概念...................................................20 C-2-9 ISP 測試原理...................................................................................20 C-2-10 SPI Serial Memory基本概念..........................................................20 Better

B-5 On Power 測試資料....................................................................................................4 B-5-1 測試程式與測試資料......................................................................................4 B-5-1-1測試程式結構......................................................................................4 B-5-1-2 自動測試程式產生器 (ATPG) 的角色................................................5 B-5-1-3測試資料分類......................................................................................6 B-5-1-4 分析報告分類......................................................................................9 B-5-2 TTL 測試程式與測試資料.............................................................................9 B-5-2-1 TTL 測試程式結構..............................................................................9 B-5-2-2 TTL 檔案格式....................................................................................10 B-5-2-3 測試動作............................................................................................16 B-5-2-4 TTL 測試的 ATPG 低階動作............................................................19 B-5-3 TREE 測試程式與測試資料.........................................................................34 B-5-3-1 TREE 測試程式結構.........................................................................34 B-5-3-2 TREE 檔案格式 – IC 基本資料語法................................................34 B-5-3-3 TREE 檔案格式 – Chain 資料語法...................................................37 B-5-3-4 測試動作............................................................................................40 B-5-3-5 TREE 測試的 ATPG 低階動作..........................................................41 B-5-3-6 檔案連結關係....................................................................................46 B-5-4 MEMORY 測試程式與測試資料.................................................................57 B-5-4-1 MEMORY測試程式結構..................................................................57 B-5-4-2 MEMORY 檔案格式..........................................................................58 B-5-4-3測試動作............................................................................................64 B-5-4-4 MEMORY 測試的 ATPG 低階動作..................................................64 B-5-5 I2C測試資料與測試程式.............................................................................68 B-5-5-1 I2C 基本概念.....................................................................................68 B-5-5-2 I2C 測試程式結構.............................................................................69 B-5-5-3 I2C 測試資料.....................................................................................69 B-5-6 P2C 測試資料與測試程式............................................................................75 B-5-6-1 P2C 基本概念....................................................................................75 B-5-6-2 P2C 測試程式結構............................................................................75 B-5-6-3 P2C 測試資料

C-1-1 Open / Short 測試原理....................................................................................3 C-1-1-1 為什麼使用短路群(Short Group)........................................................3 C-1-1-2 如何形成短路群..................................................................................4 C-1-1-3 如何決定Raw THD之值....................................................................5 C-1-1-4 短路測試原理......................................................................................5 C-1-1-5 OPI 與SPI測試...................................................................................7 C-1-2 JUMPER測試原理.........................................................................................8 C-1-2-1 模式0 (使用開路/短路(OPS)量測)....................................................8 C-1-2-2 模式1 (使用電阻量測)........................................................................8 C-1-2-3 模式2 (使用電阻量測)........................................................................9 C-1-3 電阻量測..........................................................................................................9 C-1-3-1電阻測試原理......................................................................................9 C-1-3-2 定電流源量測 MODE 0......................................................................9 C-1-3-3 低電流之定電流源量測MODE 1....................................................10 C-1-3-4 快速電阻測試MODE2.....................................................................10 C-1-4 電容量測........................................................................................................11 C-1-4-1電容測試原理....................................................................................11 C-1-4-2 AC Measure (MODE 0,1,2,3).............................................................13 C-1-4-3 CX // RX (MODE 5,6,7)....................................................................13 C-1-4-4 DC Constant Current test MODE4, MODE8.....................................14 C-1-5 電感量測........................................................................................................15 C-1-5-1電感量測原理....................................................................................15 C-1-5-2 AC Measure (MODE 0,1,2,3).............................................................16 C-1-5-3 Lx // Rx (MODE 5,6,7).............

Overview.................................................................................................................... 3 Terminology .............................................................................................................. 4 Test Program Structure............................................................................................ 5 Identifier............................................................................................................... 6 Data Types .......................................................................................................... 8 Constants ............................................................................................................ 9 Variable Declarations......................................................................................... 10 Operators .......................................................................................................... 10 Expressions....................................................................................................... 13 Statements ........................................................................................................ 14 Analog Testing........................................................................................................ 15 Analog Test Statements..................................................................................... 16 Digital Testing ......................................................................................................... 18 UUT Pin Definitions ........................................................................................... 18 Nail State Specification Routines....................................................................... 20 Digital Test Keywords ........................................................................................ 21 Digital Test Statements ...................................................................................... 22 Non-Test (Utility) Keywords................................................................................... 47 Utility Statements............................................................................................... 48 Functional Instrumentation Statements ............................................................... 71 GPIB Statements............................................................................................... 72 RS-232 Statements ...........................................................................................

bios 烧录一些注意事项 仅供参考 这些经验是在实际测总结出来了