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前向纠错编码（FEC）技术通过在传输码列中加入冗余纠错码，在一定条件下，通过解码可以自动纠正传输误码，降低接收信号的误码率（BER）。 本算法每8bit增加4bit监督位，就纠错1bit

hp8920[编程]指令说明文档 英文版 Overview of the Test Set The Test Set combines up to 22 separate test instruments and an Instrument BASIC (IBASIC) Controller into one package. All of the Test Set’s functions can be automatically controlled through application programs running on the built-in IBASIC Controller or on an external controller connected through HP-IB. Developing programs for the Test Set is simplified if the programmer has a basic understanding of how the Test Set operates. An overview of the Test Set’s operation is best presented in terms of how information flows through the unit. The simplified block diagrams shown in figure 1 on page 8 and figure 2 on page 9 depict how instrument control information and measurement result information are routed among the Test Set’s instruments, instrument control hardware, built-in IBASIC controller, and other components. The Test Set has two operating modes: Manual Control mode and Automatic Control mode. In Manual Control mode the Test Set’s operation is controlled through the front panel keypad/rotary knob. There are two Automatic Control modes: Internal and External. In Internal Automatic Control mode the Test Set’s operation is controlled by an application program running on the built-in IBASIC Controller. In External Automatic Control mode the Test Set’s operation is controlled by an external controller connected to the Test Set through the HP-IB interface.

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